Semiconductor measurement technology : progress report, October 1 to December 31, 1974

LDR 01033cam a2200229 i 4500
001 006865972
003 MiAaHDL
005 20141009010000.0
006 m d
007 cr bn ---auaua
008 760428s1975 dcua f00110 eng d
035 ‡asdr-uiuc195079
035 ‡asdr-miu.990068659720106381
035 ‡9AAU-6910
035 ‡a(OCoLC)2144759
040 ‡aVJA ‡cVJA ‡dOCL ‡dUIU
245 0 0 ‡aSemiconductor measurement technology : ‡bprogress report, October 1 to December 31, 1974 / ‡cW. Murray Bullis, ed.
260 0 ‡aWashington : ‡bU.S. Dept. of Commerce, National Bureau of Standards ; for sale by the Supt. of Docs., U.S. Govt. Print. Off., ‡c1975.
300 ‡aviii, 69 p. : ‡bill. ; 26 cm.
490 0 ‡aNBS special publication 400-17
500 ‡aSupt. of Docs. no. : C13.10: 400-17.
504 ‡aIncludes bibliographical references and index.
538 ‡aMode of access: Internet.
650 0 ‡aSemiconductors ‡xMeasurement.
700 1 0 ‡aBullis, W. Murray, ‡d1930-
710 1 1 ‡aUnited States. ‡bNational Bureau of Standards.
CID ‡a006865972
DAT 0 ‡a20020415161358.0 ‡b20141009010000.0
DAT 1 ‡a20141112162027.0 ‡b2023-03-13T18:27:46Z
CAT ‡aSDR-UIUC ‡dUNKNOWN ‡lloader.pl-003-020
FMT ‡aBK
HOL ‡0sdr-uiuc195079 ‡auiug ‡bSDR ‡cUIUC ‡puiug.30112104131476 ‡sUIU ‡z400-17 ‡1195079
974 ‡bUIU ‡cUIUC ‡d20230313 ‡sgoogle ‡uuiug.30112104131476 ‡z400-17 ‡y1975 ‡rpd ‡qbib ‡tUS fed doc
974 ‡bMIU ‡cGWLA ‡d20240225 ‡sgoogle ‡umdp.39015077586207 ‡y1975 ‡rpd ‡qbib ‡tUS fed doc