LDR | |
01033cam a2200229 i 4500 |
001 |
|
006865972 |
003 |
|
MiAaHDL |
005 |
|
20141009010000.0 |
006 |
|
m d |
007 |
|
cr bn ---auaua |
008 |
|
760428s1975 dcua f00110 eng d |
035 |
⊔ |
⊔ |
‡asdr-uiuc195079
|
035 |
⊔ |
⊔ |
‡asdr-miu.990068659720106381
|
035 |
⊔ |
⊔ |
‡9AAU-6910
|
035 |
⊔ |
⊔ |
‡a(OCoLC)2144759
|
040 |
⊔ |
⊔ |
‡aVJA
‡cVJA
‡dOCL
‡dUIU
|
245 |
0 |
0 |
‡aSemiconductor measurement technology :
‡bprogress report, October 1 to December 31, 1974 /
‡cW. Murray Bullis, ed.
|
260 |
0 |
⊔ |
‡aWashington :
‡bU.S. Dept. of Commerce, National Bureau of Standards ; for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
‡c1975.
|
300 |
⊔ |
⊔ |
‡aviii, 69 p. :
‡bill. ; 26 cm.
|
490 |
0 |
⊔ |
‡aNBS special publication 400-17
|
500 |
⊔ |
⊔ |
‡aSupt. of Docs. no. : C13.10: 400-17.
|
504 |
⊔ |
⊔ |
‡aIncludes bibliographical references and index.
|
538 |
⊔ |
⊔ |
‡aMode of access: Internet.
|
650 |
⊔ |
0 |
‡aSemiconductors
‡xMeasurement.
|
700 |
1 |
0 |
‡aBullis, W. Murray,
‡d1930-
|
710 |
1 |
1 |
‡aUnited States.
‡bNational Bureau of Standards.
|
CID |
⊔ |
⊔ |
‡a006865972
|
DAT |
0 |
⊔ |
‡a20020415161358.0
‡b20141009010000.0
|
DAT |
1 |
⊔ |
‡a20141112162027.0
‡b2023-03-13T18:27:46Z
|
CAT |
⊔ |
⊔ |
‡aSDR-UIUC
‡dUNKNOWN
‡lloader.pl-003-020
|
FMT |
⊔ |
⊔ |
‡aBK
|
HOL |
⊔ |
⊔ |
‡0sdr-uiuc195079
‡auiug
‡bSDR
‡cUIUC
‡puiug.30112104131476
‡sUIU
‡z400-17
‡1195079
|
974 |
⊔ |
⊔ |
‡bUIU
‡cUIUC
‡d20230313
‡sgoogle
‡uuiug.30112104131476
‡z400-17
‡y1975
‡rpd
‡qbib
‡tUS fed doc
|
974 |
⊔ |
⊔ |
‡bMIU
‡cGWLA
‡d20240225
‡sgoogle
‡umdp.39015077586207
‡y1975
‡rpd
‡qbib
‡tUS fed doc
|