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| 029 | 1 | ⊔ | ‡aNLGGC ‡b113099088 |
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| 035 | ⊔ | ⊔ | ‡a(OCoLC)3962040 |
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| 049 | ⊔ | ⊔ | ‡aUIUU |
| 050 | 1 | 4 | ‡aC13.10:400-25 |
| 050 | ⊔ | 4 | ‡aQC100 ‡b.U57 no.400-, 25 |
| 082 | 0 | 4 | ‡a621.381/52 |
| 086 | 0 | ⊔ | ‡aC 13.10:400-25 |
| 110 | 1 | ⊔ | ‡aUnited States. ‡bNational Bureau of Standards. |
| 245 | 1 | 0 | ‡aSemiconductor measurement technology : ‡bprogress report, July 1 to December 31, 1975 / ‡cW. Murray Bullis, editor. |
| 260 | ⊔ | ⊔ | ‡a[Washington] : ‡bU.S. Dept. of Commerce, National Bureau of Standards, ‡c1976. |
| 300 | ⊔ | ⊔ | ‡aviii, 77 p. : ‡bill. ; ‡c26 cm. |
| 490 | 0 | ⊔ | ‡aNBS special publication ; ‡v400-19 |
| 504 | ⊔ | ⊔ | ‡aIncludes bibliographical references and index. |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| 650 | ⊔ | 7 | ‡aSemiconducteurs ‡xMesure. ‡2ram |
| 650 | ⊔ | 7 | ‡aSemiconducteurs ‡xEssais. ‡2ram |
| 650 | ⊔ | 0 | ‡aSemiconductors ‡xTesting. |
| 650 | ⊔ | 0 | ‡aSemiconductors ‡xMeasurement. |
| 700 | 1 | ⊔ | ‡aBullis, W. Murray, ‡d1930- |
| 776 | 0 | 8 | ‡iOnline version: ‡aUnited States. National Bureau of Standards. ‡tSemiconductor measurement technology. ‡d[Washington] : U.S. Dept. of Commerce, National Bureau of Standards, 1976 ‡w(OCoLC)607707427 |
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