Automated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics

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086 0 ‡aC 13.10:400-30
100 1 ‡aChristou, A.
245 1 0 ‡aAutomated scanning low-energy electron probe (ASLEEP) for semiconductor wafer diagnostics / ‡cA. Christou.
246 1 6 ‡aSemiconductor measurement technology.
260 ‡aWashington, D.C. : ‡bU.S. Dept. of Commerce, National Bureau of Standards : ‡bFor sale by the Supt. of Docs., U.S. Govt. Print. Off., ‡c1978.
300 ‡av, 32 p. : ‡bill. ; ‡c26 cm.
490 0 ‡aU.S. Department of Commerce National Bureau of Standards special publication ; ‡v400-30
504 ‡aIncludes bibliographical references.
538 ‡aMode of access: Internet.
650 0 ‡aSemiconductor wafers ‡xTesting.
650 0 ‡aProbes (Electronic instruments)
710 1 ‡aUnited States. ‡bNational Bureau of Standards. ‡tSpecial publication.
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