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Microelectronic test pattern NBS-4 /
W. Robert Thurber and Martin G. Buehler.

APA Citation

Thurber, W. Robert., Buehler, M. G., United States. National Bureau of Standards. (1978). Microelectronic test pattern NBS-4. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards .

MLA Citation

Thurber, W. Robert, Martin G Buehler, and United States. National Bureau of Standards. Microelectronic Test Pattern NBS-4. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards , 1978.

Warning: These citations may not always be complete (especially for serials).