Suppression of premature dielectric breakdown for high-voltage capacitance measurements /

LDR 01653cam a2200373 i 4500
001 006865954
003 MiAaHDL
005 20141009010000.0
006 m d
007 cr bn ---auaua
008 770609s1977 dcua b f000 0 eng
010 ‡a 77608129
029 1 ‡aNZ1 ‡b12270609
029 1 ‡aAU@ ‡b000000928860
029 1 ‡aNLGGC ‡b11323516X
035 ‡asdr-uiuc485988
035 ‡asdr-miu006865954
035 ‡a(OCoLC)3088709
040 ‡aDLC ‡cDLC ‡dOCLCQ ‡dBTCTA
049 ‡aUIUU
050 0 0 ‡aQC100 ‡b.U57 no. 400-37 ‡aTK7872.C65
082 0 0 ‡a602/.1 s ‡a621.31/5
086 0 ‡aC13.10:400-37
100 1 ‡aGoodman, Alvin M.
245 1 0 ‡aSuppression of premature dielectric breakdown for high-voltage capacitance measurements / ‡cAlvin M. Goodman ; jointly supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards.
260 ‡aWashington : ‡bThe Bureau : ‡bFor sale by the Supt. of Docs., U.S. Govt. Print. Off., ‡c1977.
300 ‡aV, 21 p. : ‡bill. ; ‡c26 cm.
490 0 ‡aSemiconductor measurement technology
490 0 ‡aNBS special publication ; 400-37
504 ‡aIncludes bibliographical references.
538 ‡aMode of access: Internet.
650 0 ‡aHigh voltages.
650 0 ‡aBreakdown (Electricity)
650 0 ‡aMetal insulator semiconductors ‡xTesting.
650 0 ‡aCapacitors ‡xTesting.
776 0 8 ‡iOnline version: ‡aGoodman, Alvin M. ‡tSuppression of premature dielectric breakdown for high-voltage capacitance measurements. ‡dWashington : The Bureau : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977 ‡w(OCoLC)609326835
CID ‡a006865954
DAT 0 ‡a20100730155550.0 ‡b20141009010000.0
DAT 1 ‡a20141112162027.0 ‡b2016-10-07T18:34:20Z
CAT ‡aSDR-UIUC ‡dUNKNOWN ‡lloader.pl-003-020
FMT ‡aBK
HOL ‡0sdr-uiuc485988 ‡auiug ‡bSDR ‡cUIUC ‡puiug.30112104076697 ‡sUIU ‡z1977 ‡1485988
974 ‡bUIU ‡cUIUC ‡d20161007 ‡sgoogle ‡uuiug.30112104076697 ‡z1977 ‡y1977 ‡rpd ‡qbib ‡tUS fed doc
974 ‡bMIU ‡cGWLA ‡d20190107 ‡sgoogle ‡umdp.39015077585266 ‡y1977 ‡rpd ‡qbib ‡tUS fed doc