Semiconductor measurement technology October 1, 1976 to March 31, 1977

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086 0 ‡aC 13.10:400-38
110 1 ‡aUnited States. ‡bNational Bureau of Standards.
245 1 0 ‡aSemiconductor measurement technology October 1, 1976 to March 31, 1977 / ‡cW. Murray Bullis, editor.
260 ‡a[Washington, D.C.] : ‡bU.S. Dept. of Commerce, National Bureau of Standards : ‡bFor sale by the Supt. of Docs., U.S. Govt. Print. Off., ‡c1979.
300 ‡aviii 86 p. : ‡bill. ; ‡c26 cm.
490 0 ‡aU.S. Department of Commerce National Bureau of Standards special publication ; ‡v400-38
500 ‡aIssued November 1979.
504 ‡aIncludes bibliographical references and index.
538 ‡aMode of access: Internet.
650 0 ‡aSemiconductors ‡xTesting.
700 1 ‡aBullis, W. Murray, ‡d1930-
710 1 ‡aUnited States. ‡bNational Bureau of Standards. ‡tSpecial publication.
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