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‡aC 13.10:400-38
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‡aUnited States.
‡bNational Bureau of Standards.
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‡aSemiconductor measurement technology October 1, 1976 to March 31, 1977 /
‡cW. Murray Bullis, editor.
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⊔ |
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‡a[Washington, D.C.] :
‡bU.S. Dept. of Commerce, National Bureau of Standards :
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‡c1979.
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‡aU.S. Department of Commerce National Bureau of Standards special publication ;
‡v400-38
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‡aIssued November 1979.
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‡aIncludes bibliographical references and index.
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‡aMode of access: Internet.
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‡bNational Bureau of Standards.
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‡mThis record was modified while in the University of Michigan Aleph system for one of the following reasons: to resolve an incorrect bibliographically determined rights status, to include a new OCLC number, or to otherwise address or update incorrect or incomplete metadata.
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