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01615cam a2200373 i 4500 |
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MiAaHDL |
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770817s1977 dcua b f000 0 eng |
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‡a 77608178
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‡aC 13.10:400-40
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‡aGoodman, Alvin M.
|
245 |
1 |
2 |
‡aA 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements /
‡cAlvin M. Goodman.
|
260 |
⊔ |
⊔ |
‡aWashington :
‡bU.S. Dept. of Commerce, National Bureau of Standards :
‡bFor sale by the Supt. of Docs., U.S. Govt. Print. Off.,
‡c1977.
|
300 |
⊔ |
⊔ |
‡avii, 49 p. :
‡bill. ;
‡c26 cm.
|
490 |
⊔ |
0 |
‡aSemiconductor measurement technology
|
490 |
0 |
⊔ |
‡aNBS special publication ; 400-40
|
504 |
⊔ |
⊔ |
‡aIncludes bibliographical references.
|
538 |
⊔ |
⊔ |
‡aMode of access: Internet.
|
650 |
⊔ |
0 |
‡aElectric meters.
|
650 |
⊔ |
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‡aElectric conductivity.
|
650 |
⊔ |
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‡aElectric capacity.
|
650 |
⊔ |
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‡aSemiconductors
‡xTesting.
|
776 |
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8 |
‡iOnline version:
‡aGoodman, Alvin M.
‡t25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements.
‡dWashington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977
‡w(OCoLC)636923662
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