LDR | |
01256nam a2200313Ia 4500 |
001 |
|
006865788 |
003 |
|
MiAaHDL |
005 |
|
20221205000000.0 |
006 |
|
m d |
007 |
|
cr bn ---auaua |
008 |
|
070705s1980 dcua ab f000 0 eng d |
035 |
⊔ |
⊔ |
‡a(MiU)990068657880106381
|
035 |
⊔ |
⊔ |
‡asdr-miu.990068657880106381
|
035 |
⊔ |
⊔ |
‡z(MiU)MIU01000000000000006865788-goog
|
035 |
⊔ |
⊔ |
‡a(OCoLC)152581317
|
035 |
⊔ |
⊔ |
‡z(MiU)Aleph006865788
|
040 |
⊔ |
⊔ |
‡aFTU
‡cFTU
‡dNSBSP
|
049 |
⊔ |
⊔ |
‡aNSBA
|
086 |
0 |
⊔ |
‡aC 13.10:400-45
|
245 |
0 |
0 |
‡aSemiconductor measurement technology :
‡b[progress report] April 1, 1977 to September 30, 1977 /
‡cW. Murray Bullis, ed.
|
260 |
⊔ |
⊔ |
‡a[Washington, D.C.] :
‡bU.S. Dept. of Commerce, National Bureau of Standards,
‡c1980.
|
300 |
⊔ |
⊔ |
‡avi, 36 p. :
‡bill. ;
‡c26 cm.
|
490 |
0 |
⊔ |
‡aU.S. Department of Commerce National Bureau of Standards special publication ;
‡v400-45
|
500 |
⊔ |
⊔ |
‡aSupt. of Docs. no.: C13.10: 400-45.
|
504 |
⊔ |
⊔ |
‡aIncludes bibliographical references.
|
538 |
⊔ |
⊔ |
‡aMode of access: Internet.
|
650 |
⊔ |
0 |
‡aSemiconductors
‡xMeasurement.
|
700 |
1 |
⊔ |
‡aBullis, W. Murray,
‡d1930-
|
710 |
1 |
⊔ |
‡aUnited States.
‡bNational Bureau of Standards.
‡tSpecial publication.
|
710 |
1 |
⊔ |
‡aUnited States.
‡bNational Bureau of Standards.
|
899 |
⊔ |
⊔ |
‡a39015077586470
|
CID |
⊔ |
⊔ |
‡a006865788
|
DAT |
0 |
⊔ |
‡b20221205000000.0
|
DAT |
1 |
⊔ |
‡a20221206110740.0
‡b2024-02-23T18:53:13Z
|
CAT |
⊔ |
⊔ |
‡aSDR-MIU
‡cmiu
‡dALMA
‡lprepare.pl-004-008
|
FMT |
⊔ |
⊔ |
‡aBK
|
HOL |
⊔ |
⊔ |
‡0sdr-miu.990068657880106381
‡aMiU
‡bSDR
‡cGWLA
‡f006865788
‡pmdp.39015077586470
‡sMIU
‡1990068657880106381
|
974 |
⊔ |
⊔ |
‡bMIU
‡cGWLA
‡d20240223
‡sgoogle
‡umdp.39015077586470
‡y1980
‡rpd
‡qbib
‡tUS fed doc
|