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781106s1978 dcua b f000 0 eng |
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‡aC 13.10:400-35
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‡aLeedy, T. F.
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‡aMicroelectronic processing laboratory at NBS /
‡cT.F. Leedy, Y.M. Liu.
|
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‡aWashington :
‡b.U.S. Dept. of Commerce, National Bureau of Standards :
‡bfor sale by the Supt. of Docs., U.S. Govt. Print. Off.,
‡c1978.
|
300 |
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‡aiv, 28 p. :
‡bill. ;
‡c27 cm.
|
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‡aSemiconductor measurement technology
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‡aNational Bureau of Standards special publication ; 400-53
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‡aMode of access: Internet.
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‡aMicroélectronique
‡xLaboratoires.
‡2ram
|
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⊔ |
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‡aSemiconducteurs
‡xEssais.
‡2ram
|
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‡aMicroelectronics.
|
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‡aElectronics laboratories.
|
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‡aTransistors.
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‡aSemiconductors
‡xTesting.
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‡aLiu, Y. M.
‡q(Yan M.),
‡ejoint author.
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‡iOnline version:
‡aLeedy, T. F.
‡tMicroelectronic processing laboratory at NBS.
‡dWashington : .U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978
‡w(OCoLC)630960572
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