Microelectronic processing laboratory at NBS

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086 0 ‡aC 13.10:400-35
100 1 ‡aLeedy, T. F.
245 1 0 ‡aMicroelectronic processing laboratory at NBS / ‡cT.F. Leedy, Y.M. Liu.
260 ‡aWashington : ‡b.U.S. Dept. of Commerce, National Bureau of Standards : ‡bfor sale by the Supt. of Docs., U.S. Govt. Print. Off., ‡c1978.
300 ‡aiv, 28 p. : ‡bill. ; ‡c27 cm.
490 0 ‡aSemiconductor measurement technology
490 0 ‡aNational Bureau of Standards special publication ; 400-53
538 ‡aMode of access: Internet.
650 7 ‡aMicroélectronique ‡xLaboratoires. ‡2ram
650 7 ‡aSemiconducteurs ‡xEssais. ‡2ram
650 0 ‡aMicroelectronics.
650 0 ‡aElectronics laboratories.
650 0 ‡aTransistors.
650 0 ‡aSemiconductors ‡xTesting.
700 1 ‡aLiu, Y. M. ‡q(Yan M.), ‡ejoint author.
776 0 8 ‡iOnline version: ‡aLeedy, T. F. ‡tMicroelectronic processing laboratory at NBS. ‡dWashington : .U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1978 ‡w(OCoLC)630960572
CID ‡a006865781
DAT 0 ‡a20100730154244.0 ‡b20141009010000.0
DAT 1 ‡a20141112162027.0 ‡b2025-01-01T18:45:32Z
DAT 2 ‡a2025-01-01T18:30:02Z
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