| LDR | 01914cam a2200457 a 4500 | ||
| 001 | 006865771 | ||
| 003 | MiAaHDL | ||
| 005 | 20221205000000.0 | ||
| 006 | m d | ||
| 007 | cr bn ---auaua | ||
| 008 | 810921s1980 dcu b f000 0 eng c | ||
| 010 | ⊔ | ⊔ | ‡a80600158 |
| 020 | ⊔ | ⊔ | ‡c$3.75 |
| 029 | 1 | ⊔ | ‡aNZ1 ‡b12276493 |
| 029 | 1 | ⊔ | ‡aAU@ ‡b000002102009 |
| 029 | 1 | ⊔ | ‡aNLGGC ‡b113128029 |
| 035 | ⊔ | ⊔ | ‡a(MiU)990068657710106381 |
| 035 | ⊔ | ⊔ | ‡asdr-miu.990068657710106381 |
| 035 | ⊔ | ⊔ | ‡asdr-uiuc452246 |
| 035 | ⊔ | ⊔ | ‡asdr-ucr991024903749704706 |
| 035 | ⊔ | ⊔ | ‡z(MiU)MIU01000000000000006865771-goog |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)7040743 |
| 035 | ⊔ | ⊔ | ‡z(MiU)Aleph006865771 |
| 040 | ⊔ | ⊔ | ‡aDGPO/DLC ‡cDLC ‡dOCLCQ ‡dBTCTA ‡dOCLCG ‡dNSBSP |
| 049 | ⊔ | ⊔ | ‡aNSBA |
| 086 | 0 | ⊔ | ‡aC 13.10:P400-63 |
| 100 | 1 | ⊔ | ‡aLarrabee, R. D. |
| 245 | 1 | 2 | ‡aA FORTRAN program for calculating the electrical parameters of extrinsic silicon / ‡cR.D. Larrabee, W.R. Thurber, and W.M. Bullis. |
| 246 | 1 | 6 | ‡aSemiconductor measurement technology. |
| 260 | ⊔ | ⊔ | ‡aWashington, D.C. : ‡bU.S. Dept. of Commerce, National Bureau of Standards : ‡bFor sale by the Supt. of Docs., U.S. G.P.O., ‡c1980. |
| 300 | ⊔ | ⊔ | ‡aiv, 48 p. ; ‡c27 cm. |
| 490 | 0 | ⊔ | ‡aU.S. Department of Commerce National Bureau of Standards special publication ; ‡v400-63 |
| 500 | ⊔ | ⊔ | ‡aItem 247. |
| 500 | ⊔ | ⊔ | ‡aS/N 003-003-02260-8. |
| 500 | ⊔ | ⊔ | ‡a"Issued October 1980." |
| 500 | ⊔ | ⊔ | ‡a"Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards." |
| 504 | ⊔ | ⊔ | ‡aIncludes bibliographical references. |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| 650 | ⊔ | 0 | ‡aFORTRAN (Computer program language) |
| 650 | ⊔ | 0 | ‡aSilicon ‡xElectric properties ‡xData processing. |
| 700 | 1 | ⊔ | ‡aBullis, W. Murray, ‡d1930- |
| 700 | 1 | ⊔ | ‡aThurber, W. Robert. |
| 710 | 1 | ⊔ | ‡aUnited States. ‡bNational Bureau of Standards. ‡tSpecial publication. |
| 710 | 2 | ⊔ | ‡aCenter for Electronics and Electrical Engineering (U.S.). ‡bElectron Devices Division. |
| 899 | ⊔ | ⊔ | ‡a39015077586181 |
| CID | ⊔ | ⊔ | ‡a006865771 |
| DAT | 0 | ⊔ | ‡b20221205000000.0 |
| DAT | 1 | ⊔ | ‡a20221208060740.0 ‡b2024-02-25T18:44:50Z |
| CAT | ⊔ | ⊔ | ‡aSDR-MIU ‡cmiu ‡dALMA ‡lprepare.pl-004-008 |
| FMT | ⊔ | ⊔ | ‡aBK |
| HOL | ⊔ | ⊔ | ‡0sdr-miu.990068657710106381 ‡aMiU ‡bSDR ‡cGWLA ‡f006865771 ‡pmdp.39015077586181 ‡sMIU ‡1990068657710106381 |
| 974 | ⊔ | ⊔ | ‡bMIU ‡cGWLA ‡d20240225 ‡sgoogle ‡umdp.39015077586181 ‡y1980 ‡rpd ‡qbib ‡tUS fed doc |
| 974 | ⊔ | ⊔ | ‡bUIU ‡cUIUC ‡d20230313 ‡sgoogle ‡uuiug.30112075693652 ‡y1980 ‡rpd ‡qbib ‡tUS fed doc |
| 974 | ⊔ | ⊔ | ‡bUC ‡cUCR ‡d20231101 ‡sgoogle ‡uuc1.31210024949149 ‡y1980 ‡rpd ‡qbib ‡tUS fed doc |