The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon /
W.R. Thurber [and others].

APA Citation

Filliben, J. J., Liu, Y. M. (Yan M.)., Mattis, R. L., Thurber, W. Robert. (1981). The Relationship between resistivity and dopant density for phosphorus- and boron-doped silicon. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards .

MLA Citation

Filliben, J. J, Y. M. (Yan M.) Liu, R. L Mattis, and W. Robert Thurber. The Relationship Between Resistivity And Dopant Density for Phosphorus- And Boron-doped Silicon. Washington, D.C.: U.S. Dept. of Commerce, National Bureau of Standards , 1981.

Warning: These citations may not always be complete (especially for serials).