Routine quantitative analysis by x-ray diffraction /
James W. Ballard and H.H. Schrenk.

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Main Author: Ballard, James W.
Related Names: Schrenk, H. H. (Helmuth Herman), 1902-
Language(s): English
Published: Washington, D.C. : U.S. Dept. of the Interior, Bureau of Mines, 1946.
Subjects: X-ray diffractometer.
Analytical chemistry > Analytical chemistry / Quantitative.
X-rays > X-rays / Diffraction.
Spectrum analysis.
Physical Description: 10 p. : ill. ; 27 cm.
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