X-ray diffraction and optical microscopic data on several important phases in the binary systems CaO-Al₂O₃, CaO-SiO₂, and Na₂O-Al₂O₃ /
by Sarkis G. Ampian.

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Main Author
Ampian, Sarkis G.
Language(s)
English
Published
[Washington, D.C.] : U.S. Dept. of the Interior, Bureau of Mines, 1964.
Subjects
X-rays > Diffraction.
X-rays > Industrial applications.
Aluminum oxide.
Aluminum silicates.
Physical Description
53 p. : ill. ; 27cm.
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