Nano- and micro-metrology :
16-17 June, 2005, Munich, Germany /
Heidi Ottevaere, Peter DeWolf, Diederick S. Wiersma ; sponsored by, SPIE Europe ; cooperating organizations, EOS--European Optical Society ... [et al.] ; published by SPIE--the International Society for Optical Engineering.

Description

Tools

Cite this Export citation file
Related Names
Wiersma, Diedrik S.
DeWolf, Peter.
Ottevaere, Heidi.
Society of Photo-optical Instrumentation Engineers.
European Optical Society.
SPIE Europe.
Language(s)
English
Published
Bellingham, Wash. : SPIE, c2005.
Subjects
Nanostructured materials > Congresses.
Metrology > Congresses.
Optical measurements > Congresses.
Physical Description
1 v. (various pagings) : ill. ; 28 cm.
ISBN
0819458589
Locate a Print Version
Find in a library

Viewability

Item Link Original Source
Limited (search only)   University of Michigan