Proceedings

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111 2 ‡aROCS Workshop. ‡0http://id.loc.gov/authorities/names/no2005026223 ‡1http://id.loc.gov/rwo/agents/no2005026223 ‡1http://viaf.org/viaf/127025978
245 1 0 ‡aProceedings / ‡cROCS Workshop.
246 1 3 ‡aROCS Workshop - reliability of compound semiconductors proceedings
260 ‡aPiscataway, NJ : ‡bIEEE, ‡c2004-
300 ‡av.
310 ‡aAnnual
336 ‡atext ‡btxt ‡2rdacontent
337 ‡aunmediated ‡bn ‡2rdamedia
338 ‡avolume ‡bnc ‡2rdacarrier
362 0 ‡aOct. 24, 2004-
500 ‡aDescription based on surrogate.
538 ‡aMode of access: Internet.
550 ‡aSponsored by JEDEC JC-14.7 Committee on Gallium Arsenide Reliability and Quality Standards, with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.
580 ‡aElectronic serial mode of access: World Wide Web via IEEE Xplore.
650 0 ‡aSemiconductors ‡xReliability ‡vCongresses.
650 0 ‡aGallium arsenide semiconductors ‡xReliability ‡vCongresses.
710 2 ‡aIEEE Xplore (Online service) ‡0http://id.loc.gov/authorities/names/no00037063 ‡1http://id.loc.gov/rwo/agents/no00037063
710 2 ‡aIEEE Electron Devices Society. ‡0http://id.loc.gov/authorities/names/n81070856 ‡1http://id.loc.gov/rwo/agents/n81070856
710 2 ‡aJEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards. ‡0http://id.loc.gov/authorities/names/n98087019 ‡1http://id.loc.gov/rwo/agents/n98087019
711 2 ‡aROCS Workshop. ‡tProceedings (Online)
780 0 0 ‡aGaAs Reliability Workshop. ‡tProceedings ‡w(DLC)sn 99052075 ‡w(OCoLC)41422619
899 ‡a39015058782494 ‡c04TH8787 2004
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