Optical metrology in production engineering :
27-30 April, 2004, Strasbourg, France /
Wolfgang Osten, Mitsuo Takeda, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, EOS--European Optical Society (United Kingdom) ... [et al.].
Description
Viewability
Item Link | Original Source |
---|---|
Limited (search only) | University of Michigan |