Microelectronics failure analysis : desk reference

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245 0 0 ‡aMicroelectronics failure analysis : ‡bdesk reference / ‡cedited by the Electronic Device Failure Analysis Society, Desk Reference Committee.
250 ⊔ ⊔ ‡a5th ed.
260 ⊔ ⊔ ‡aMaterials Park, Ohio : ‡bASM International, ‡cc2004.
300 ⊔ ⊔ ‡axiv, 800 p. : ‡bill. ; ‡c28 cm. + ‡e1 CD-ROM (4 3/4 in.)
336 ⊔ ⊔ ‡atext ‡btxt ‡2rdacontent
337 ⊔ ⊔ ‡aunmediated ‡bn ‡2rdamedia
338 ⊔ ⊔ ‡avolume ‡bnc ‡2rdacarrier
500 ⊔ ⊔ ‡aPrevious editions published as: Microelectronic failure analysis.
504 ⊔ ⊔ ‡aIncludes bibliographical references and indexes.
505 0 0 ‡gIntroduction -- ‡tFailure analysis process flow -- ‡tFailure verification -- ‡tFailure mode: failure classifications -- ‡tSpecial devices -- ‡tNon-destructive analysis techniques -- ‡tDepackaging -- ‡tPhoton emission (electroluminescence) localization techniques -- ‡tMicrothermography -- ‡tLaser and particle beam-based localization techniques -- ‡tDeprocessing -- ‡tGeneral imaging techniques -- ‡tLocal deprocessing and imaging -- ‡tMaterials analysis techniques -- ‡tImportant topics for semiconductor devices -- ‡tFA techniques/tools roadmaps -- ‡tFA operation and management -- ‡gAppendix.
538 ⊔ ⊔ ‡aMode of access: Internet.
538 ⊔ ⊔ ‡aSystem requirements for accompanying CD-ROM: Windows 95/98/NT/ME/2000/XP or Macintosh 8/9/Classic; CD-ROM drive.
650 ⊔ 0 ‡aMicroelectronics ‡xDefects ‡xTesting ‡vHandbooks, manuals, etc.
650 ⊔ 0 ‡aMicroelectronics ‡xMaterials ‡xTesting ‡vHandbooks, manuals, etc.
710 2 ⊔ ‡aElectronic Device Failure Analysis Society. ‡bDesk Reference Committee.
740 0 ⊔ ‡aMicroelectronic failure analysis.
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