Semiconductor measurement technology :
techniques for measuring the integrity of passivation overcoats on integrated circuits /
Werner Kern and Robert B. Comizzoli ; RCA Laboratories.

APA Citation

Kern, W., Comizzoli, R. B., Radio Corporation of America. Laboratories Division., United States. Defense Advanced Research Projects Agency., United States. National Bureau of Standards. (1977). Semiconductor measurement technology: techniques for measuring the integrity of passivation overcoats on integrated circuits. Washington: Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off..

MLA Citation

United States. National Bureau of Standards, et al.. Semiconductor Measurement Technology: Techniques for Measuring the Integrity of Passivation Overcoats On Integrated Circuits. Washington: Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off., 1977.