Optical metrology for arts and multimedia : 25-26 June, 2003, Munich, Germany

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245 0 0 ‡aOptical metrology for arts and multimedia : ‡b25-26 June, 2003, Munich, Germany / ‡cRenzo Salimbeni, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by, EOS--European Optical Society (Germany), WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany).
260 ‡aBellingham, Wash. : ‡bSPIE, ‡cc2003.
300 ‡axii, 266 p. : ‡bill. (some col.) ; ‡c28 cm.
336 ‡atext ‡btxt ‡2rdacontent
337 ‡aunmediated ‡bn ‡2rdamedia
338 ‡avolume ‡bnc ‡2rdacarrier
490 0 ‡aSPIE proceedings series ; ‡vv. 5146
504 ‡aIncludes bibliographical references and author index.
538 ‡aMode of access: Internet.
650 0 ‡aImage processing ‡vCongresses. ‡0http://id.loc.gov/authorities/subjects/sh2008104259
650 0 ‡aOptical measurements ‡vCongresses. ‡0http://id.loc.gov/authorities/subjects/sh2008108676
700 1 ‡aSalimbeni, Renzo.
710 2 ‡aWissenschaftliche Gesellschaft Lasertechnik. ‡0http://id.loc.gov/authorities/names/no99053610 ‡1http://id.loc.gov/rwo/agents/no99053610
710 2 ‡aEuropean Optical Society. ‡0http://id.loc.gov/authorities/names/n92062713 ‡1http://id.loc.gov/rwo/agents/n92062713
710 2 ‡aSociety of Photo-Optical Instrumentation Engineers. ‡0http://id.loc.gov/authorities/names/n78088934 ‡1http://id.loc.gov/rwo/agents/n78088934
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