Charged particle detection, diagnostics, and imaging :
30 July-2 August 2001, San Diego, USA /
Olivier Delage, Eric Munro, John A. Rouse, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
APA Citation
Rouse, J. A., Munro, E., Delage, O., Society of Photo-optical Instrumentation Engineers. (2001). Charged particle detection, diagnostics, and imaging: 30 July-2 August 2001, San Diego, USA. Bellingham, Wash.: SPIE.
MLA Citation
Rouse, John A, Eric Munro, Olivier Delage, and Society of Photo-optical Instrumentation Engineers. Charged Particle Detection, Diagnostics, And Imaging: 30 July-2 August 2001, San Diego, USA. Bellingham, Wash.: SPIE, 2001.
Warning: These citations may not always be complete (especially for serials).