Improved analysis of DNA short tandem repeats with time-of-flight mass spectrometry /
John M. Butler and Christopher H. Becker.

Description

Main Author

Butler, John M. (John Marshall), 1969-

Related Names

Becker, Christopher H.

Language(s)

English

Published

Washington, D.C. : U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice, [2001]

Subjects

DNA > DNA / analysis.
Genetic Markers.
DNA > DNA / Analysis.
Time-of-flight mass spectrometry.
Genetic markers.
Forensic genetics > Forensic genetics / Methodology.

Note

"NCJ 188292."
"October 2001."

Physical Description

ix, 75 p. : ill. (some col.) ; 28 cm.

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