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‡aInstruments for optics and optoelectronic inspection and control :
‡b8-10 November 2000, Beijing, China /
‡cGuang Hui Wei, Sheng Liu, chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering.
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‡aBellingham, Wash., USA :
‡bSPIE,
‡cc2000.
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‡axx, 268 p. :
‡bill. ;
‡c28 cm.
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‡atext
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‡aSPIE proceedings series ;
‡vv. 4223
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‡aIncludes bibliographical references and index.
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‡aMode of access: Internet.
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‡aQuality control
‡vCongresses.
‡0http://id.loc.gov/authorities/subjects/sh2008110285
|
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‡aDetectors
‡xIndustrial applications
‡vCongresses.
‡0http://id.loc.gov/authorities/subjects/sh2009123259
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‡aOptoelectronic devices
‡xIndustrial applications
‡vCongresses.
|
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‡aIntegrated optics
‡vCongresses.
‡0http://id.loc.gov/authorities/subjects/sh2008104737
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‡aLiu, S.
‡q(Sheng),
‡d1963-
‡0http://id.loc.gov/authorities/names/no97079856
‡1http://id.loc.gov/rwo/agents/no97079856
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‡aWei, Guang Hui.
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‡aSociety of Photo-Optical Instrumentation Engineers.
‡0http://id.loc.gov/authorities/names/n78088934
‡1http://id.loc.gov/rwo/agents/n78088934
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‡aZhongguo wu li xue hui.
‡0http://id.loc.gov/authorities/names/n82115301
‡1http://id.loc.gov/rwo/agents/n82115301
|
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‡aChina Optics & Optoelectronic Manufacturers Association.
‡0http://id.loc.gov/authorities/names/nr96042602
‡1http://id.loc.gov/rwo/agents/nr96042602
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