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‡aMEMS reliability for critical applications :
‡b20 September 2000, Santa Clara, USA /
‡cRussell A. Lawton, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, SolidState Technology, [and] Sandia National Laboratories (USA).
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‡aMicroelectromechanical systems reliability for critical applications
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‡aBellingham, Wash., USA :
‡bSPIE,
‡cc2000.
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‡aMicroelectromechanical systems
‡xReliability
‡vCongresses.
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‡aLawton, Russell A.
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‡aSandia National Laboratories.
‡0http://id.loc.gov/authorities/names/n80115974
‡1http://id.loc.gov/rwo/agents/n80115974
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‡aSolid State Technology (Organization)
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‡aSemiconductor Equipment and Materials International.
‡0http://id.loc.gov/authorities/names/n90682619
‡1http://id.loc.gov/rwo/agents/n90682619
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‡aSociety of Photo-Optical Instrumentation Engineers.
‡0http://id.loc.gov/authorities/names/n78088934
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