Microelectronic manufacturing yield, reliability, and failure analysis /
sponsored and published by SPIE--the International Society for Optical Engineering.
APA Citation
Semiconductor Equipment and Materials International., Society of Photo-Optical Instrumentation Engineers. (1995). Microelectronic manufacturing yield, reliability, and failure analysis. Bellingham, Wash., USA: SPIE.
MLA Citation
Semiconductor Equipment and Materials International, and Society of Photo-Optical Instrumentation Engineers. Microelectronic Manufacturing Yield, Reliability, And Failure Analysis. Bellingham, Wash., USA: SPIE, 1995.
Warning: These citations may not always be complete (especially for serials).