Catalog Record: National Semiconductor Metrology Program : [catalog] | HathiTrust Digital Library

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National Semiconductor Metrology Program :
[catalog] /
EEEL, Semiconductor Electronics Division, Office of Microelectronics Programs [i.e. National Semiconductor Metrology Program].

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Previous Title: Semiconductor measurement technology
Corporate Author: National Institute of Standards and Technology (U.S.)
Language(s): English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1995-
Subjects: National Semiconductor Metrology Program (U.S.) > National Semiconductor Metrology Program (U.S.) / Bibliography > National Semiconductor Metrology Program (U.S.) / Bibliography / Catalogs.
Semiconductors > Semiconductors / Measurement > Semiconductors / Measurement / Bibliography > Semiconductors / Measurement / Bibliography / Catalogs.
Note: Title from cover.
Physical Description: v. ; 28 cm.
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Item Link Original Source
Full view Pennsylvania State University
Full view Pennsylvania State University
Full view1990/94-1990/95 University of California
Full view1990/96-1990/97 University of California
Full view1990/98 University of California
Full view1990/99 University of California
Full view1995 University of Michigan
Full view1996 Columbia University
Full view1996 University of Michigan
Full view1996 University of Michigan
Full view1997 University of Michigan
Full view1997 Columbia University
Full view1998 Columbia University
Full view1999 University of Michigan
Full view1999 Columbia University
Full view2000 University of Michigan
Full view2000 Columbia University