Developments in materials characterization technologies :
symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA /
edited by George F. Vander Voort, John J. Friel.

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Related Names
Friel, John J.
Vander Voort, George F.
International Metallographic Society. Technical Meeting
Language(s)
English
Published
Columbus, Ohio : International Metallographic Society ; c1996.
Subjects
Metallography > Congresses
Materials > Microscopy > Congresses.
Nondestructive testing > Congresses
Materials > Testing > Congresses.
Physical Description
vii, 125 p. : ill. ; 29 cm.
ISBN
087170580X
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