Developments in materials characterization technologies : symposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA

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245 0 0 ‡aDevelopments in materials characterization technologies : ‡bsymposium held 23 and 24 July 1995, during the 28th Annual Technical Meeting of the International Metallographic Society, Albuquerque, New Mexico, USA / ‡cedited by George F. Vander Voort, John J. Friel.
260 ⊔ ⊔ ‡aColumbus, Ohio : ‡bInternational Metallographic Society ; ‡aMaterials Park, Ohio : ‡bASM International, ‡cc1996.
300 ⊔ ⊔ ‡avii, 125 p. : ‡bill. ; ‡c29 cm.
504 ⊔ ⊔ ‡aIncludes bibliographical references.
538 ⊔ ⊔ ‡aMode of access: Internet.
650 ⊔ 0 ‡aMetallography ‡xCongresses
650 ⊔ 0 ‡aMaterials ‡xMicroscopy ‡xCongresses.
650 ⊔ 0 ‡aNondestructive testing ‡xCongresses
650 ⊔ 0 ‡aMaterials ‡xTesting ‡xCongresses.
700 1 ⊔ ‡aFriel, John J.
700 1 ⊔ ‡aVander Voort, George F.
710 2 ⊔ ‡aInternational Metallographic Society. ‡bTechnical Meeting ‡n(28th : ‡d1995 : ‡cAlbuquerque, N.M.)
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