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Asian Test Symposium /
sponsored by IEEE Computer Society Test Technology Technical Committee in cooperation with Technical Group on Fault Toletant Systems (IEICE) [and others].

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Meeting Name
Asian Test Symposium.
Related Names
IEEE Xplore (Online service)
IEEE Computer Society. Test Technology Technical Committee.
Language(s)
English
Published
Los Alamitos, CA : IEEE Computer Society Press, 1992-
Subjects
Fault-tolerant computing > Congresses.
Electronic circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Note
Description based on surrogate.
Physical Description
v. : ill. ; 28 cm
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Item Link Original Source
Limited (search only)   92TH0458-0 1992 University of Michigan
Limited (search only)   94TH8016 1994 University of Michigan
Limited (search only)   95CS8084 1995 University of Michigan
Limited (search only)   96TB100072 1996 University of Michigan
Limited (search only)   97TB100205 1997 University of Michigan
Limited (search only)   98TB100259 1998 University of Michigan
Limited (search only)   P2235 2004 University of Michigan
Limited (search only)   P2481 2005 University of Michigan
Limited (search only)   PR00315 1999 University of Michigan
Limited (search only)   PR00887 2000 University of Michigan
Limited (search only)   PR01378 2001 University of Michigan
Limited (search only)   PR01825 2002 University of Michigan
Limited (search only)   PR01951 2003 University of Michigan
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