Asian Test Symposium /
sponsored by IEEE Computer Society Test Technology Technical Committee in cooperation with Technical Group on Fault Toletant Systems (IEICE) ... [et al.]

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Meeting Name
Asian Test Symposium.
Related Names
IEEE Xplore (Online service)
IEEE Computer Society. Test Technology Technical Committee.
Language(s)
English
Published
Los Alamitos, CA : IEEE Computer Society Press, 1992-
Subjects
Fault-tolerant computing > Congresses.
Electronic circuits > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Note
Description based on surrogate.
Physical Description
v. : ill. ; 28 cm.
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Limited (search only)   92TH0458-0 1992 University of Michigan
Limited (search only)   94TH8016 1994 University of Michigan
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