Semiconductor measurement technology /
U.S. Department of Commerce, National Institute of Standards and Technology.

Description

New Title

National Semiconductor Metrology Program : [catalog]

Previous Title

Semiconductor measurement technology

Corporate Author

National Institute of Standards and Technology (U.S.)

Language(s)

English

Published

[Gaithersburg, Md.?] : The Institute,

Subjects

National Institute of Standards and Technology (U.S.) > National Institute of Standards and Technology (U.S.) / Bibliography > National Institute of Standards and Technology (U.S.) / Bibliography / Catalogs.
Semiconductors > Semiconductors / Measurement > Semiconductors / Measurement / Bibliography > Semiconductors / Measurement / Bibliography / Catalogs.

Note

Description based on: Mar. 1990; title from cover.

Physical Description

v. ; 28 cm.

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