Available Indexes

Semiconductor measurement technology /
U.S. Department of Commerce, National Institute of Standards and Technology.

Description

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New Title: National Semiconductor Metrology Program : [catalog]
Previous Title: Semiconductor measurement technology
Corporate Author: National Institute of Standards and Technology (U.S.)
Language(s): English
Published: [Gaithersburg, Md.?] : The Institute,
Subjects: National Institute of Standards and Technology (U.S.) > National Institute of Standards and Technology (U.S.) / Bibliography > National Institute of Standards and Technology (U.S.) / Bibliography / Catalogs.
Semiconductors > Semiconductors / Measurement > Semiconductors / Measurement / Bibliography > Semiconductors / Measurement / Bibliography / Catalogs.
Note: Description based on: Mar. 1990; title from cover.
Physical Description: v. ; 28 cm.
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Full view 1990/1993 University of Michigan
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