Annual IEEE Semiconductor Thermal Measurement and Management Symposium

LDR 02026nas a22004331a 4500
001 002546141
003 MiAaHDL
005 20240704000000.0
006 m d
007 cr bn ---auaua
008 920707c19919999nyuar 1 | 0eng d
010 ‡asn 91037286 ‡z90086005
035 ‡a(MiU)990025461410106381
035 ‡asdr-miu.990025461410106381
035 ‡z(MiU)MIU01000000000000002546141-goog
035 ‡a(OCoLC)23885876
035 ‡a(RLIN)MIUG92-S1146
035 ‡z(MiU)Aleph002546141
040 ‡aViBlbV ‡cViBlbV ‡dPPiU ‡dCStRLIN ‡dMiU
042 ‡alcd
050 1 ‡aTK7871.85 ‡b.I27
111 2 ‡aIEEE Semiconductor Thermal Measurement and Management Symposium.
245 1 0 ‡aAnnual IEEE Semiconductor Thermal Measurement and Management Symposium.
246 1 ‡iIEEE Xplore homepage title: ‡aSemiconductor Thermal Measurement and Management Symposium, ... Annual IEEE
246 1 7 ‡aIEEE SEMI-THERM Symposium
246 1 4 ‡aIEEE ... annual Semiconductor Thermal Measurement & Management Symposium
260 ‡aNew York, NY : ‡bIEEE, ‡cc1991-
300 ‡av. : ‡bill. ; ‡c29 cm.
310 ‡aAnnual
362 0 ‡a7th (Feb. 12-14, 1991)-
530 ‡aAlso issued online.
538 ‡aMode of access: Internet.
550 ‡aSponsored by the IEEE Components, Hybrids, and Manufacturing Technology Society.
580 ‡aElectronic serial mode of access: World Wide Web via IEEE Xplore.
650 0 ‡aIntegrated circuits ‡vCongresses.
650 0 ‡aAmorphous semiconductors ‡xThermal properties ‡vCongresses.
650 0 ‡aSemiconductors ‡xCooling ‡vCongresses.
650 0 ‡aSemiconductors ‡xThermal properties ‡vCongresses.
710 2 ‡aIEEE Components, Hybrids, and Manufacturing Technology Society.
740 0 ‡aAnnual IEEE Semiconductor Thermal Measurement and Management Symposium (Online)
780 0 0 ‡aIEEE Semiconductor Thermal and Temperature Measurement Symposium. ‡tAnnual IEEE Semiconductor Thermal and Temperature Measurement Symposium ‡w(OCoLC)18312350 ‡w(DLC)sn 91037278
899 ‡a39015020004613 ‡c91CH2972-8 1991
CID ‡a002546141
DAT 0 ‡a20100622084237.0 ‡b20240704000000.0
DAT 1 ‡a20240704060829.0 ‡b2024-07-05T05:18:20Z
DAT 2 ‡a2023-04-30T17:30:02Z
CAT ‡aSDR-MIU ‡cmiu ‡dALMA ‡lprepare.pl-004-008
FMT ‡aSE
HOL ‡0sdr-miu.990025461410106381 ‡aMiU ‡bSDR ‡cMIU ‡f002546141 ‡pmdp.39015020004613 ‡sMIU ‡z91CH2972-8 1991 ‡1990025461410106381
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015020004613 ‡z91CH2972-8 1991 ‡y1991 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015023296893 ‡z92CH3095-7 1992 ‡y1992 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015023882197 ‡z93CH3226-8 1993 ‡y1993 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240704 ‡sgoogle ‡umdp.39015026532526 ‡z94CH3413-2 1994 ‡y1994 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015030255734 ‡z95CH35733 1995 ‡y1995 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015035247694 ‡z96CB35890 1996 ‡y1996 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240704 ‡sgoogle ‡umdp.39015036268145 ‡z97CB36031 1997 ‡y1997 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015039849479 ‡z98CB36195 1998 ‡y1998 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240704 ‡sgoogle ‡umdp.39015047353209 ‡z99CB36306 1999 ‡y1999 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015048215993 ‡z00CB37068 2000 ‡y2000 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015048236775 ‡z01CH37189 2001 ‡y2001 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240704 ‡sgoogle ‡umdp.39015048297504 ‡z02CH37311 2002 ‡y2002 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015047893691 ‡z03CH37437 2003 ‡y2003 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015048091915 ‡z04CH37545 2004 ‡y2004 ‡ric ‡qbib ‡tUS serial item date >= 1929
974 ‡bMIU ‡cMIU ‡d20240705 ‡sgoogle ‡umdp.39015058298012 ‡z05CH37651 2005 ‡y2005 ‡ric ‡qbib ‡tUS serial item date >= 1929