Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium.

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New Title: Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Previous Title: Semi-therm
Meeting Name: IEEE Semiconductor Thermal and Temperature Measurement Symposium.
Related Names: IEEE Components, Hybrids, and Manufacturing Technology Society.
Language(s): English
Published: [New York, N.Y.] : Institute of Electrical and Electronics Engineers, c1988-1990.
Subjects: Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Congresses.
Integrated circuits > Integrated circuits / Thermal properties > Integrated circuits / Thermal properties / Congresses.
Semiconductors > Semiconductors / Thermal properties > Semiconductors / Thermal properties / Congresses.
Note: Sponsored by : Components, Hybrids, and Manufacturing Technology Society of the IEEE.
Physical Description: 3 v. : ill. ; 28 cm.
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Item Link	Original Source
Limited (search only) 88CH2530-4 1988	University of Michigan
Limited (search only) 89CH2688-0 1989	University of Michigan
Limited (search only) 90CH2640-1	University of Michigan

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