02359nas a22004811a 4500002237384MiAaHDL20250726000000.0m d cr bn ---auaua910225d19811982nyuar 1 a0eng dsn 83010301 0743-1686(MiU)990022373840106381sdr-miu.990022373840106381(MiU)MIU01000000000000002237384-goog(OCoLC)8301802(RLIN)MIUG91-S318(MiU)Aleph002237384ICIICINSTNSDPNSTm/cNSDPOCoLCMiUUtOrBLWxlcnsdp62111International Test Conference.http://id.loc.gov/authorities/names/n82036743http://id.loc.gov/rwo/agents/n82036743Dig. pap. - Int. Test Conf.Digest of papers - International Test ConferenceDigest of papers /International Test Conference.IEEE ... International Test Conference1982IEEE Test Conference1981New York :Institute of Electrical and Electronics Engineers,1981-1982.2 v. :ill. ;28 cmAnnualtexttxtrdacontentunmediatednrdamediavolumencrdacarrier1981-1982.Each conference also has distinctive title.Mode of access: Internet.Sponsored by: the IEEE Computer Society, Test Technology Committee, and: the Philadelphia Section of the IEEE.SemiconductorsTestingCongresses.http://id.loc.gov/authorities/subjects/sh2010112608Integrated circuitsTestingCongresses.http://id.loc.gov/authorities/subjects/sh2008104739Computer storage devicesCongresses.http://id.loc.gov/authorities/subjects/sh2009121193Institute of Electrical and Electronics Engineers.Philadelphia Section.http://id.loc.gov/authorities/names/n80056672http://id.loc.gov/rwo/agents/n80056672IEEE Computer Society.Test Technology Committee.http://id.loc.gov/authorities/names/n79020249http://id.loc.gov/rwo/agents/n79020249Test Conference.Digest of papers(OCoLC)7201481International Test Conference.Proceedings(OCoLC)103422683901500049834881CH1693-100223738420241218060109.020250726000000.020260318165557.02026-03-19T14:35:05Z2011-08-10T15:30:07ZSDR-MIUmiuALMAprepare.pl-004-009SEsdr-miu.990022373840106381MiUSDRMIU002237384mdp.39015000498348MIU81CH1693-1990022373840106381MIUMIU20260319googlemdp.3901500049834881CH1693-11982undbibUS bib date2 >= 1931MIUMIU20260313googlemdp.3901500294616182CH1808-51982undbibUS bib date2 >= 1931