A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films /
[by] Frank L. McCrackin and James P. Colson.

Description

Tools

Cite this Export citation file

Main Author: McCrackin, F. L. (Frank L.)
Related Names: Colson, James P., author.
Language(s): English
Published: Washington : For sale by the Superintendent of Documents, U.S. Govt. Print. Off, 1964.
Subjects: Thin films.
Optical measurements.
Reflection (Optics)
FORTRAN (Computer program language)
Physical Description: 42 p.
Locate a Print Version: Find in a library

Viewability

Item Link	Original Source
Full view	Technical Report Archive & Image Library
Full view	University of Illinois at Urbana-Champaign

View HathiTrust MARC record

Similar Items

A Fortran program for analysis of ellipsometer measurements

Author: McCrackin, F. L. (Frank L.)
Published: 1969

Tables of solutions to Bragg's equation for copper, cobalt, iron, and chromium K©Æa radiation and small diffraction angles

Author: Colson, James P.
Published: 1968

Applied optics

Author: American Institute of Physics
Published: 1962

Year book of veterinary medicine

Author: Riley, William F.
Published: 1963

Literature, music, fine arts

Published: 1968

Medicine, science, and the law

Author: British Academy of Forensic Sciences.
Published: 1960

Proceedings - Astronomical Society of Australia

Author: Astronomical Society of Australia
Published: 1967

The Asian trade unionist

Author: Asian Trade Union College, Calcutta, India.
Published: 1963

Comprehensive psychiatry

Author: American Psychopathological Association.
Published: 1960

Journal of the Regional Cultural Institute

Author: Muåssasah-i Farhangī-i Minṭaqagahī̊.
Published: 1967