Catalog Record: Calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples | HathiTrust Digital Library

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Calculations for comparing two-point and four-point probe resistivity measurements on rectangular bar-shaped semiconductor samples.

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Main Author: Swartzendruber, Lydon J.
Language(s): English
Published: Washington, [U.S. Dept. of Commerce, National Bureau of Standards]; for sale by the Supt. of Docs., Govt. Print. Off., 1964.
Subjects: FORTRAN (Computer program language)
Semiconductors.
Electric resistance.
Physical Description: 25 p. illus.
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