LDR | |
00859nam a22002171 4500 |
001 |
|
002027765 |
003 |
|
MiAaHDL |
005 |
|
20210817000000.0 |
006 |
|
m d |
007 |
|
cr bn ---auaua |
008 |
|
900614s1962 pau|||||||||||||||||eng| |
010 |
⊔ |
⊔ |
‡a62051720
|
035 |
⊔ |
⊔ |
‡a(MiU)990020277650106381
|
035 |
⊔ |
⊔ |
‡asdr-miu.990020277650106381
|
035 |
⊔ |
⊔ |
‡a(OCoLC)10081780
|
035 |
⊔ |
⊔ |
‡a(SAZTEC)136803200
|
035 |
⊔ |
⊔ |
‡a(CaOTULAS)176929722
|
035 |
⊔ |
⊔ |
‡z(MiU)Aleph002027765
|
040 |
⊔ |
⊔ |
‡cSAZTEC
|
110 |
2 |
⊔ |
‡aAmerican Society for Testing and Materials.
‡bCommittee F-1 on Materials for Electron Tubes and Semiconductor Devices.
|
245 |
1 |
0 |
‡aASTM standards on materials for electron tubes and semiconductor devices, with related information;
‡bspecifications, methods of testing.
|
250 |
⊔ |
⊔ |
‡a2d ed.
|
260 |
⊔ |
⊔ |
‡aPhiladelphia,
‡bAmerican Society for Testing and Materials,
‡c1962.
|
300 |
⊔ |
⊔ |
‡axii, 892 p.
‡billus., tables.
‡c24 cm.
|
538 |
⊔ |
⊔ |
‡aMode of access: Internet.
|
650 |
⊔ |
0 |
‡aElectron tubes
‡xMaterials
|
CID |
⊔ |
⊔ |
‡a002027765
|
DAT |
0 |
⊔ |
‡a19900614000000.0
‡b20210817000000.0
|
DAT |
1 |
⊔ |
‡a20210920183725.0
‡b2024-11-02T17:56:25Z
|
DAT |
2 |
⊔ |
‡a2024-11-02T17:30:02Z
‡b2014-01-10T21:00:03Z
|
CAT |
⊔ |
⊔ |
‡aSDR-MIU
‡dALMA
‡lprepare.pl-004-008
|
FMT |
⊔ |
⊔ |
‡aBK
|
HOL |
⊔ |
⊔ |
‡0sdr-miu.990020277650106381
‡aMiU
‡bSDR
‡cMIU
‡pmdp.39015047377422
‡sMIU
‡1990020277650106381
|
974 |
⊔ |
⊔ |
‡bMIU
‡cMIU
‡d20241102
‡sgoogle
‡umdp.39015047377422
‡y1962
‡rpd
‡qren
|