ASTM standards on materials for electron tubes and semiconductor devices, with related information; specifications, methods of testing

LDR 00859nam a22002171 4500
001 002027765
003 MiAaHDL
005 20210817000000.0
006 m d
007 cr bn ---auaua
008 900614s1962 pau|||||||||||||||||eng|
010 ‡a62051720
035 ‡a(MiU)990020277650106381
035 ‡asdr-miu.990020277650106381
035 ‡a(OCoLC)10081780
035 ‡a(SAZTEC)136803200
035 ‡a(CaOTULAS)176929722
035 ‡z(MiU)Aleph002027765
040 ‡cSAZTEC
110 2 ‡aAmerican Society for Testing and Materials. ‡bCommittee F-1 on Materials for Electron Tubes and Semiconductor Devices.
245 1 0 ‡aASTM standards on materials for electron tubes and semiconductor devices, with related information; ‡bspecifications, methods of testing.
250 ‡a2d ed.
260 ‡aPhiladelphia, ‡bAmerican Society for Testing and Materials, ‡c1962.
300 ‡axii, 892 p. ‡billus., tables. ‡c24 cm.
538 ‡aMode of access: Internet.
650 0 ‡aElectron tubes ‡xMaterials
CID ‡a002027765
DAT 0 ‡a19900614000000.0 ‡b20210817000000.0
DAT 1 ‡a20210920183725.0 ‡b2024-11-02T17:56:25Z
DAT 2 ‡a2024-11-02T17:30:02Z ‡b2014-01-10T21:00:03Z
CAT ‡aSDR-MIU ‡dALMA ‡lprepare.pl-004-008
FMT ‡aBK
HOL ‡0sdr-miu.990020277650106381 ‡aMiU ‡bSDR ‡cMIU ‡pmdp.39015047377422 ‡sMIU ‡1990020277650106381
974 ‡bMIU ‡cMIU ‡d20241102 ‡sgoogle ‡umdp.39015047377422 ‡y1962 ‡rpd ‡qren