Accelerated testing :
statistical models, test plans and data analysis /
Wayne Nelson.

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Main Author
Nelson, Wayne, 1936-
Language(s)
English
Published
New York : Wiley, c1990.
Subjects
Accelerated life testing > Statistical methods.
Reliability (Engineering) > Statistical methods.
Failure time data analysis.
Note
Includes index.
"A Wiley-Interscience publication."
Physical Description
xiv, 601 p. : ill. ; 25 cm.
ISBN
0471522775
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Limited (search only)   University of Michigan