01283nam a22003611a 4500001830484MiAaHDL20250726000000.0m d cr bn ---auaua900305s1989 nyua b 001 0 eng 89031893 0471615536(MiU)990018304840106381sdr-miu.990018304840106381sdr-ucbk.991025547979706532(MiU)MIU01000000000000001830484-goog(OCoLC)19514573(RLIN)MIUG90-B8360(MiU)Aleph001830484NjRCStMiUUtOrBLWQA278.2.H67 1989519.5/3620Hosmer, David W.Applied logistic regression /David W. Hosmer, Jr., Stanley Lemeshow.New York :Wiley,c1989.xiii, 307 p. :ill. ;24 cm.texttxtrdacontentunmediatednrdamediavolumencrdacarrierWiley series in probability and mathematical statistics. Applied probability and statisticsIncludes index."A Wiley-Interscience publication."Bibliography: p. 291-300.Mode of access: Internet.Regression analysis.http://id.loc.gov/authorities/subjects/sh85112392Lemeshow, Stanley.3901502163081200183048420241217203130.020250726000000.020260227165550.02026-02-28T09:26:35Z2025-06-14T17:30:02ZSDR-MIUmiuALMAprepare.pl-004-009BKsdr-miu.990018304840106381MiUSDRMIU001830484mdp.39015021630812MIU990018304840106381MIUMIU20260228googlemdp.390150216308121989icbibUS bib date1 >= 1931UCUCBK20221208berkeleyucbk.ark:/28722/h2rf5m0181989icbibUS bib date1 >= 1931