Catalog Record: Semiconductor reliability | HathiTrust Digital Library

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Semiconductor reliability.
Edited by John E. Shwop [and] Harold J. Sullivan.

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Related Names: Sullivan, Harold J. , Shwop, John E.
Language(s): English
Published: Elizabeth, N. J., Engineering Publishers; trade distributors: Reinhold Pub. Corp., New York [1961]
Subjects: Semiconductors > Semiconductors / Reliability > Semiconductors / Reliability / Congresses.
Note: "Sponsored by the Working Group on Semiconductor Devices, Advisory Group on Electron Tubes, Dept. of Defense."
Physical Description: ix, 309 p. illus., diagrs., tables. 24 cm.
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