Autotestcon :
[proceedings].
Description
- Language(s)
-
English
- Published
-
[New York, N.Y. : Institute of Electrical and Electronics Engineers, c1976]-c1983.
- Note
-
Some v. have distinctive titles.
Issue for '78 has title: Conference record; for '81: Proceedings.
Title from cover.
Also issued online.
Sponsored by: Institute of Electrical and Electronics Engineers, IEEE Aerospace and Electronic Systems Society, and IEEE Group on Instrumentation & Measurement (after <'78>, IEEE Instrumentation and Measurement Society).
- Physical Description
-
8 v. :
ill. ;
28 cm
Viewability