Measurement techniques for thin films.
Edited by Bertram Schwartz and Newton Schwartz.
Description
- Language(s)
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English
- Published
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New York : Electronics Division and Dielectrics and Insulation Division, Electrochemical Society, [1967]
- Note
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Consists of most of the papers presented at two symposia: a symposium held in Buffalo, N.Y., Oct. 11, 1965, and sponsored by the Electronics Division of the Electrochemical Society; and a symposium held in Philadelphia Oct. 10-11, 1966, and sponsored jointly by the Electronics Division and the Dielectrics and Insulation Division of the Electrochemical Society.
- Physical Description
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vi, 364 p. :
illus. ;
22 cm.
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