Interferometric metrology :
20-21, August 1987, San Diego, California /
sponsored by SPIE, the International Society for Optical Engineering, cooperating organizations: Applied Optics Laboratory, New Mexico State University ... [et al.]; N.A. Massie, editor.

Description

Related Names

Massie, N.A.
Society of Photo-optical Instrumentation Engineers.
New Mexico State University. Applied Optics Laboratory.

Language(s)

English

Published

Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c1988.

Subjects

Speckle metrology > Speckle metrology / Congresses.
Optical measurements > Optical measurements / Congresses.

Note

Includes index.

Physical Description

vi, 239 p. : ill. ; 28 cm.

ISBN

0892528516

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