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‡aMeasurement and effects of surface defects and quality of polish :
‡bJanuary 21-22, 1985, Los Angeles, California /
‡ccosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors.
|
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⊔ |
⊔ |
‡aBellingham, Wash., USA :
‡bSPIE--the International Society for Optical Engineering,
‡c©1985.
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‡avi, 198 pages :
‡billustrations ;
‡c28 cm.
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‡atext
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‡aProceedings of SPIE--the International Society for Optical Engineering ;
‡vv. 525
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‡aIncludes bibliographical references and index.
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⊔ |
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‡aAlso issued online.
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‡aMode of access: Internet.
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‡vCongresses.
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‡aConference papers and proceedings.
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‡0(OCoLC)fst01423772
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‡aBennett, Harold Earl,
‡d1929-
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‡aBaker, L. R.
‡q(Lionel R.)
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‡aSira Limited.
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