Methods of measurement for semiconductor materials, process control, and devices;
quarterly report.

APA Citation

United States. National Bureau of Standards. Methods of measurement for semiconductor materials, process control, and devices. [Washington: For sale by the Supt. of Docs., U.S. Govt. Print. Off.].

MLA Citation

United States. National Bureau of Standards. Methods of Measurement for Semiconductor Materials, Process Control, And Devices. [Washington: For sale by the Supt. of Docs., U.S. Govt. Print. Off.],

Warning: These citations may not always be complete (especially for serials).