Materials analysis by ion channeling : submicron crystallography

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050 0 ‡aQC176.8.C45 ‡bF44 1982
082 0 ‡a620.1/1299 ‡219
100 1 ‡aFeldman, Leonard C.
245 1 0 ‡aMaterials analysis by ion channeling : ‡bsubmicron crystallography / ‡cLeonard C. Feldman, James W. Mayer, S. Thomas Picraux.
260 ‡aNew York : ‡bAcademic Press, ‡c1982.
300 ‡axix, 300 p. : ‡bill. ; ‡c24 cm.
500 ‡aIncludes index.
504 ‡aBibliography: p. 235-295.
538 ‡aMode of access: Internet.
650 0 ‡aCrystallography
650 0 ‡aIon bombardment
650 0 ‡aCrystals ‡xDefects
650 0 ‡aSolids ‡xSurfaces
650 0 ‡aChanneling (Physics)
700 1 ‡aPicraux, S. T., ‡d1943-
700 1 ‡aMayer, James W., ‡d1930-
CID ‡a000442716
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