| LDR | 00767nam a22002531a 4500 | ||
| 001 | 000391171 | ||
| 003 | MiAaHDL | ||
| 005 | 20210817000000.0 | ||
| 006 | m d | ||
| 007 | cr bn ---auaua | ||
| 008 | 880718s1986 nyua b 00110 eng | ||
| 010 | ⊔ | ⊔ | ‡a85021884 |
| 020 | ⊔ | ⊔ | ‡a0060444444 |
| 035 | ⊔ | ⊔ | ‡a(MiU)990003911710106381 |
| 035 | ⊔ | ⊔ | ‡asdr-miu.990003911710106381 |
| 035 | ⊔ | ⊔ | ‡a(OCoLC)12558607 |
| 035 | ⊔ | ⊔ | ‡a(CaOTULAS)160130676 |
| 035 | ⊔ | ⊔ | ‡a(RLIN)MIUG86-B99624 |
| 035 | ⊔ | ⊔ | ‡z(MiU)Aleph000391171 |
| 040 | ⊔ | ⊔ | ‡dCStRLIN |
| 050 | 0 | ⊔ | ‡aTK7868.D5 ‡bM49 1986 |
| 082 | 0 | ⊔ | ‡a621.3815 ‡219 |
| 100 | 1 | ⊔ | ‡aMiczo, Alexander. |
| 245 | 1 | 0 | ‡aDigital logic testing and simulation / ‡cAlexander Miczo. |
| 260 | ⊔ | ⊔ | ‡aNew York : ‡bHarper & Row, ‡cc1986. |
| 300 | ⊔ | ⊔ | ‡axiv, 414 p. : ‡bill. ; ‡c24 cm. |
| 504 | ⊔ | ⊔ | ‡aIncludes bibliographies and index. |
| 538 | ⊔ | ⊔ | ‡aMode of access: Internet. |
| 650 | ⊔ | 0 | ‡aDigital electronics ‡xTesting. |
| CID | ⊔ | ⊔ | ‡a000391171 |
| DAT | 0 | ⊔ | ‡a19880718000000.0 ‡b20210817000000.0 |
| DAT | 1 | ⊔ | ‡a20210926182523.0 ‡b2023-09-16T17:44:17Z |
| CAT | ⊔ | ⊔ | ‡aSDR-MIU ‡dALMA ‡lprepare.pl-004-008 |
| FMT | ⊔ | ⊔ | ‡aBK |
| HOL | ⊔ | ⊔ | ‡0sdr-miu.990003911710106381 ‡aMiU ‡bSDR ‡cMIU ‡pmdp.39015010876673 ‡sMIU ‡1990003911710106381 |
| 974 | ⊔ | ⊔ | ‡bMIU ‡cMIU ‡d20230916 ‡sgoogle ‡umdp.39015010876673 ‡y1986 ‡ric ‡qbib ‡tUS bib date1 >= 1929 |
| 974 | ⊔ | ⊔ | ‡bMIU ‡cMIU ‡d20230413 ‡sgoogle ‡umdp.39015031707741 ‡y1986 ‡ric ‡qbib ‡tUS bib date1 >= 1929 |