Practical scanning electron microscopy : electron and ion microprobe analysis

LDR 01118nam a22003131i 4500
001 000266758
003 MiAaHDL
005 20220528000000.0
006 m d
007 cr bn ---auaua
008 880718s1975 nyua b 00110 eng
010 ‡a74034162
020 ‡a0306308207
035 ‡a(MiU)990002667580106381
035 ‡asdr-miu.990002667580106381
035 ‡z(MiU)MIU01000000000000000266758-goog
035 ‡a(OCoLC)1174600
035 ‡a(CaOTULAS)160495230
035 ‡a(RLIN)MIUG82-B19338
035 ‡z(MiU)Aleph000266758
040 ‡dMiU
050 0 ‡aQH212.S3 ‡bG64
082 ‡a502/.8
100 1 ‡aGoldstein, Joseph, ‡d1939-2015.
245 1 0 ‡aPractical scanning electron microscopy : ‡belectron and ion microprobe analysis / ‡cedited by Joseph I. Goldstein and Harvey Yakowitz ; forward by T. E. Everhart.
260 ‡aNew York : ‡bPlenum Press, ‡c1975.
300 ‡axviii, 582 p. : ‡bill. ; ‡c24 cm.
504 ‡aIncludes bibliographical references and index.
538 ‡aMode of access: Internet.
650 0 ‡aMicroprobe analysis.
650 0 ‡aScanning electron microscopes.
700 1 ‡aYakowitz, Harvey, ‡d1939- ‡ejoint author.
899 ‡a39015018211634
CID ‡a000266758
DAT 0 ‡a19880718000000.0 ‡b20220528000000.0
DAT 1 ‡a20220529234014.0 ‡b2023-11-09T19:00:26Z
CAT ‡aSDR-MIU ‡dALMA ‡lprepare.pl-004-008
FMT ‡aBK
HOL ‡0sdr-miu.990002667580106381 ‡aMiU ‡bSDR ‡cMIU ‡pmdp.39015018211634 ‡sMIU ‡1990002667580106381
974 ‡bMIU ‡cMIU ‡d20231109 ‡sgoogle ‡umdp.39015018211634 ‡y1975 ‡ric ‡qbib ‡tUS bib date1 >= 1929