Digest of papers /
International Test Conference.

Description

New Title

Proceedings

Previous Title

Digest of papers

Meeting Name

International Test Conference.

Related Names

Institute of Electrical and Electronics Engineers. Philadelphia Section.
IEEE Computer Society. Test Technology Committee.

Language(s)

English

Published

New York : Institute of Electrical and Electronics Engineers, 1981-1982.

Subjects

Semiconductors > Semiconductors / Testing > Semiconductors / Testing / Congresses.
Integrated circuits > Integrated circuits / Testing > Integrated circuits / Testing / Congresses.
Computer storage devices > Computer storage devices / Congresses.

Note

Each conference also has distinctive title.
Sponsored by: the IEEE Computer Society, Test Technology Committee, and: the Philadelphia Section of the IEEE.

Physical Description

2 v. : ill. ; 28 cm

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