International Integrated Reliability Workshop final report.

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Meeting Name
International Integrated Reliability Workshop.
Related Names
IEEE Reliability Society.
IEEE Electron Devices Society.
Language(s)
English
Published
[Piscataway, NJ] : The Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, Inc.,
Subjects
Integrated circuits > Reliability > Congresses.
Note
Description based on surrogate of: 1994.
Sponsored by: IEEE Electron Devices Society and IEEE Reliability Society.
Physical Description
v. : ill. ; 28 cm.
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Item Link Original Source
Limited (search only)   00TH8515 2000 University of Michigan
Limited (search only)   01TH8580 2001 University of Michigan
Limited (search only)   02TH8634 2002 University of Michigan
Limited (search only)   03TH8715 2003 University of Michigan
Limited (search only)   04TH8752 2004 University of Michigan
Limited (search only)   05TH8799 2005 University of Michigan
Limited (search only)   94TH0654-4 1994 University of Michigan
Limited (search only)   95TH8086 1995 University of Michigan
Limited (search only)   96TH8215 1996 University of Michigan
Limited (search only)   97TH8319 1997 University of Michigan
Limited (search only)   98TH8363 1998 University of Michigan
Limited (search only)   99TH8460 1999 University of Michigan
Limited (search only)   1997 University of Illinois at Urbana-Champaign
Limited (search only)   2004 University of Illinois at Urbana-Champaign