Records of the ... IEEE International Workshop on Memory Technology, Design, and Testing /
sponsored by the IEEE Computer Society Technical Committee on Test Technology, in cooperation with the IEEE Computer Society Technical Committee on VLSI.

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Previous Title
Records of the... IEEE International Workshop on Memory Testing
Meeting Name
IEEE International Workshop on Memory Technology, Design, and Testing.
Related Names
IEEE Computer Society. Technical Committee on VLSI.
IEEE Computer Society. Test Technology Technical Committee.
IEEE International Workshop on Memory Technology, Design, and Testing.
Language(s)
English
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1994-
Subjects
Random access memory > Congresses.
Semiconductor storage devices > Testing > Congresses.
Physical Description
v. : ill. ; 28 cm
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Item Link Original Source
Limited (search only) 95TH8065 1995 University of Michigan
Limited (search only) 96TB100042 1996 University of Michigan
Limited (search only) 97TB100159 1997 University of Michigan
Limited (search only) 98TB100236 1998 University of Michigan
Limited (search only) P2193 2004 University of Michigan
Limited (search only) P2313 2005 University of Michigan
Limited (search only) PR00259 1999 University of Michigan
Limited (search only) PR00689 2000 University of Michigan
Limited (search only) PR01242 2001 University of Michigan
Limited (search only) PR01617 2002 University of Michigan
Limited (search only) PR02004 2003 University of Michigan