Proceedings.

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Meeting Name
Asian Test Symposium.
Related Names
IEEE Computer Society. Test Technology Technical Committee.
Language(s)
English
Published
Los Alamitos, Calif. : IEEE Computer Society Press, c1992-
Subjects
Electronic circuits > Testing > Congresses.
Fault-tolerant computing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Note
Sponsored by: IEEE Computer Society Test Technology Technical Committee and various local groups.
Physical Description
v. : ill. ; 28 cm.
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